涵盖Charger、ICT、Semiconductor Pin等不同类型的探针， 主要应用在芯片测试、手机摄像头模组测试、 PCBA测试、指 纹识别及人脸识别模组测试等。
基于顾客的需求，我们提供最优探针设计和综合解决方案。
Covering Charger, ICT, Semiconductor Pin and other different types of probes, mainly used in chip testing, mobile phone camera module testing, PCBA testing, finger recognition and face recognition module testing.
Based on customer requirements, we provide optimal probe design and integrated solutions.
